Monitoring general linear profiles when random errors have contaminated normal distributions

Quality and Reliability Engineering International

Volumn 30, Issue 8, 2014, Pages 1131-1144

  Huwang, Longcheen ^a   Wang, Yi Hua Tina ^b   Shen, Cheng Che ^a  

^a NATIONAL TSING HUA UNIVERSITY   (Taiwan)

^b TAMKANG UNIVERSITY   (Taiwan)

Author keywords

Average run length; Control chart; EWMA; Out of control; Phase I; Phase II; Trimmed least squares estimation

Indexed keywords

CONTROL CHARTS; FLOWCHARTING; NORMAL DISTRIBUTION; ROBUSTNESS (CONTROL SYSTEMS);

AVERAGE RUN LENGTHS; EWMA; LEAST SQUARES ESTIMATION; OUT-OF-CONTROL; PHASE I; PHASE II;

RANDOM ERRORS;

EID: 84912050150     PISSN: 07488017     EISSN: 10991638     Source Type: Journal    
DOI: 10.1002/qre.1536     Document Type: Article

References (39)

1. Kang L, Albin SL. On-line monitoring when the process yields a linear profile. Journal of Quality Technology 2000; 32:418-426
2. Kim K, Mahmoud MA, Woodall WH. On the monitoring of linear profiles. Journal of Quality Technology 2003; 32:317-328
3. Gupta S, Montgomery DC, Woodall WH. Performance evaluation of two methods for online monitoring of linear calibration profiles. International Journal of Production Research 2006; 44:1927-1942
4. Croarkin C, Varner R. Measurement assurance for dimensional measurements on integrated-circuit photomasks. NBS Technical Note 1164, U. S. Department of Commerce
5. Mahmoud MA, Woodall WH. Phase I monitoring of linear profiles with calibration application. Technometrics 2004; 46:380-391
6. Zou C, Zhang Y, Wang Z. Control chart based on change-point model for monitoring linear profiles. IIE Transactions 2006; 38:1093-1103
7. Mahmoud MA, Parker PA, Woodall WH, Hawkins DM. A change point method for linear profile data. Quality and Reliability Engineering International 2007; 23:247-268
8. Zou C, Zhou C, Wang X, Tsung F. A self-starting control chart for linear profiles. Journal of Quality Technology 2007; 39:364-375
9. Zou C, Tsung F, Wang Z. Monitoring general linear profiles using multivariate exponentially weighted moving average schemes. Technometrics 2007; 49:395-408
10. Jesen DR, Hui YV, Ghare PM. Monitoring an input-output model for production. I: The control charts. Management Science 1984; 30:1197-1206
11. Mestek O, Pavlik J, Suchanek M. Multivariate control charts: control charts for calibration curves. Journal of Analytical Chemistry 1994; 350:344-351
12. Stover FS, Brill RV. Statistical quality control applied to ionchromatography calibrations. Journal of Chromatography. A 1998; 804:37-43
13. Lawless JF, Mackay RJ, Robinson JA. Analysis of variation transmission in manufacturing process, Part I. Journal of Quality Technology 1999; 31:131-142
14. Wang YT, Huwang L. On the monitoring of simple linear Berkson profiles. Quality and Reliability Engineering International 2012; 28:949-965
15. Walker E, Wright S. Comparing curves using additive models. Journal of Quality Technology 2002; 34:118-129
16. Woodall WH, Spitzner DJ, Montgomery DC, Gupta S. Using control charts to monitor process and product quality profiles. Journal of Quality Technology 2004; 36:309-320
17. Williams JD, Woodall WH, Birch JB. Statistical monitoring of nonlinear product and process quality profiles. Quality and Reliability Engineering International 2007; 23:925-941
18. Colosimo BM, Pacella M. On the use of principal component analysis to identify systematic patterns in roundness profiles. Quality and Reliability Engineering International 2007; 23:707-725
19. Williams JD, Birch JB, Woodall WH, Ferry NM. Statistical monitoring of heteroscedastic dose-response profiles from high-throughput screening. Journal of Agricultural, Biological, and Environmental Statistics 2007; 12:216-235
20. Yeh AB, Huwang L, Li Y. Profile monitoring for a binary response. IIE Transactions 2009; 41:931-941
21. Shang Y, Tsung F, Zou C. Phase II profile monitoring with binary data and random predictors. Journal of Quality Technology 2011; 43:196-208
22. Jin J, Shi J. Feature-preserving data compression of stamping tonnage information using wavelet. Technometrics 1999; 41:327-339
23. Lada EK, Lu JC, Wilson JR. A wavelet-based procedure for process fault detection. IEEE Transactions on Semiconductor Manufacturing 2002; 15:79-90
24. Ding Y, Zeng L, Zhou S. (2006) Phase I analysis for monitoring nonlinear profiles in manufacturing processes. Journal of Quality Technology 2006; 38:199-216
25. Zou C, Tsung F, Wang Z. Monitoring profiles based on nonparametric regression methods. Technometrics 2008; 50:512-526
26. Fan J, Zhang C, Zhang J. Generalized likelihood ratio statistics and Wilks phenomenon. The Annals of Statistics 2001; 29:153-193
27. Fan J, Gijbels I. Local Polynomial Modeling and Its Applications. Chapman & Hall: London, 1996
28. Qiu P, Zou C, Wang Z. Nonparametric profile monitoring by mixed effects modeling. Technometrics 2010; 52:265-293
29. Zi X, Zou C, Tsung F. A distribution-free, robust method for monitoring linear profiles using rank-based regression. IIE Transactions 2012; in press
30. Lehmann EL. Theory of Point Estimation. Wiley: New York, 1983
31. Stigler SM. Do robust estimators work with real data? The Annals of Statistics 1977; 5:1055-1098
32. Koenker R, Bassett GJ. Regression quantiles. Econometrica 1978; 46:33-50
33. Koenker R. Galton, Edgeworth, Frisch, and Prospects for quantile regression in Econometrics. Journal of Econometrics 2000; 95:347-374
34. Koenker R, Hallock K. Quantile regression. Journal of Economic Perspectives 2001; 15:143-156
35. Meketon M. Least absolute value regression. AT & T Bell Laboratories, Holmdel, NJ, 1986
36. Rupport D, Carroll R. Trimmed least squares estimation in the linear model. Journal of the American Statistical Association 1980; 75:828-838
37. Lowry CA, Woodall WH, Champ CW, Rigdon SE. A multivariate exponentially weighted moving average control chart. Technometrics 1992; 34:46-53
38. Prabhu SS, Runger GC. Designing a multivariate EWMA control chart. Journal of Quality Technology 1997; 29:8-15
39. Shi J. Stream of Variation Modeling and Analysis for Multistage Manufacturing Processes. CRC Press: Florida, 2007.