Cryogenic x-ray diffraction microscopy utilizing high-pressure cryopreservation

Physical Review E - Statistical, Nonlinear, and Soft Matter Physics

Volumn 90, Issue 4, 2014, Pages

  Lima, Enju ^a   Chushkin, Yuriy ^b   Van Der Linden, Peter ^b   Kim, Chae Un ^c,d   Zontone, Federico ^b   Carpentier, Philippe ^b   Gruner, Sol M ^d,e   Pernot, Petra ^b  

^a BROOKHAVEN NATIONAL LABORATORY   (United States)

^b EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^c Ulsan National Institute of Science and Technology   (South Korea)

^d Cornell High Energy Synchrotron Source ^*  (United States)

^e School of Operations Research and Industrial Engineering   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRYO-PRESERVATION; X-RAY DIFFRACTION MICROSCOPY;

ICE;

COMPARATIVE STUDY; CRYOPRESERVATION; DEINOCOCCUS; IMAGE PROCESSING; MICROSCOPY; PRESSURE; PROCEDURES; SMALL ANGLE SCATTERING; X RAY; X RAY DIFFRACTION;

CRYOPRESERVATION; DEINOCOCCUS; ICE; IMAGE PROCESSING, COMPUTER-ASSISTED; MICROSCOPY; PRESSURE; SCATTERING, SMALL ANGLE; X-RAY DIFFRACTION; X-RAYS;

EID: 84908424087     PISSN: 15393755     EISSN: 15502376     Source Type: Journal    
DOI: 10.1103/PhysRevE.90.042713     Document Type: Article

References (36)

1. R. Feder, J. Costa, P. Chaudhari, and D. Sayre, Science 212, 1398 (1981). SCIEAS 0036-8075 10.1126/science.7233227
2. P. Cloetens, R. Barrett, J. Baruchel, J. P. Guigay, and M. Schlenker, J. Phys. D: Appl. Phys. 29, 133 (1996). JPAPBE 0022-3727 10.1088/0022-3727/29/1/023
3. M. D. de Jonge, C. Holzner, S. B. Baines, B. S. Twining, K. Ignatyev, J. Diaz, D. L. Howard, D. Legnini, A. Miceli, I. McNulty, C. J. Jacobsen, and S. Vogt, Proc. Natl. Acad. Sci. USA 107, 15676 (2010). PNASA6 0027-8424 10.1073/pnas.1001469107
4. G. Schneider, P. Guttmann, S. Heim, S. Rehbein, F. Mueller, K. Nagashima, J. B. Heymann, W. G. Muller, and J. G. McNally, Nat. Methods 7, 985 (2010). 1548-7091 10.1038/nmeth.1533
5. M. Lamvik, J. Microsc. 161, 171 (1991). JMICAR 0022-2720 10.1111/j.1365-2818.1991.tb03081.x
6. H. Chapman, A. Barty, S. Marchesini, A. Noy, S. Hau-Riege, C. Cui, M. Howells, R. Rosen, J. S. H. He, U. Weierstall, T. Beetz, C. Jacobsen, and D. Shapiro, J. Opt. Soc. Am. A 23, 1179 (2006). 1084-7529 10.1364/JOSAA.23.001179
7. Q. Shen, I. Bazarov, and P. Thibault, J. Synchrotron Radiat. 11, 432 (2004). JSYRES 0909-0495 10.1107/S0909049504016772
8. M. Howells, T. Beetz, H. Chapman, C. Cui, J. Holton, C. Jacobsen, J. Kirz, E. Lima, S. Marchesini, H. Miao, D. Sayre, D. Shapiro, J. Spence, and D. Starodub, J. Electron Spectrosc. Relat. Phenom. 170, 4 (2009). JESRAW 0368-2048 10.1016/j.elspec.2008.10.008
9. J. R. Fienup, Appl. Opt. 21, 2758 (1982). APOPAI 0003-6935 10.1364/AO.21.002758
10. V. Elser, J. Opt. Soc. Am. A 20, 40 (2003). 1084-7529 10.1364/JOSAA.20.000040
11. J. Miao, K. Hodgson, T. Ishikawa, C. Larabell, M. Legros, and Y. Nishino, Proc. Natl. Acad. Sci. USA 100, 110 (2003). PNASA6 0027-8424 10.1073/pnas.232691299
12. D. Shapiro, P. Thibault, T. Beetz, V. Elser, M. Howells, C. Jacobsen, J. Kirz, E. Lima, H. Miao, A. M. Neiman, and D. Sayre, Proc. Natl. Acad. Sci. USA 102, 15343 (2005). PNASA6 0027-8424 10.1073/pnas.0503305102
13. J. W. Miao, Y. Nishino, Y. Kohmura, B. Johnson, C. Y. Song, S. H. Risbud, and T. W. Ishikawa, Phys. Rev. Lett. 95, 085503 (2005). PRLTAO 0031-9007 10.1103/PhysRevLett.95.085503
14. M. A. Pfeifer, G. J. Williams, I. A. Vartanyants, R. Harder, and I. K. Robinson, Nature (London) 442, 63 (2006). 0028-0836 10.1038/nature04867
15. A. Barty, S. Marchesini, H. N. Chapman, C. Cui, M. R. Howells, D. A. Shapiro, A. M. Minor, J. C. H. Spence, U. Weierstall, J. Ilavsky, A. Noy, S. P. Hau-Riege, A. B. Artyukhin, T. Baumann, T. Willey, J. Stolken, T. van Buuren, and J. H. Kinney, Phys. Rev. Lett. 101, 055501 (2008). PRLTAO 0031-9007 10.1103/PhysRevLett.101.055501
16. Y. Nishino, Y. Takahashi, N. Imamoto, T. Ishikawa, and K. Maeshima, Phys. Rev. Lett. 102, 018101 (2009). PRLTAO 0031-9007 10.1103/PhysRevLett.102.018101
17. K. Giewekemeyer, P. Thibault, S. Kalbfleisch, A. Beerlink, C. M. Kewish, M. Dierolf, F. Pfeiffer, and T. Salditt, Proc. Natl. Acad. Sci. USA 107, 529 (2010). PNASA6 0027-8424 10.1073/pnas.0905846107
18. S. Boutet, Science 337, 362 (2012). SCIEAS 0036-8075 10.1126/science.1217737
19. J. Miao, P. Charalambous, J. Kirz, and D. Sayre, Nature (London) 400, 342 (1999). NATUAS 0028-0836 10.1038/22498
20. R. M. Glaeser and K. A. Taylor, J. Microsc. 112, 127 (1978). JMICAR 0022-2720 10.1111/j.1365-2818.1978.tb01160.x
21. S. Williams, X. Zhang, C. Jacobsen, J. Kirz, S. Lindaas, J. V. Hof, and S. S. Lamm, J. Microsc. 170, 155 (1993). JMICAR 0022-2720 10.1111/j.1365-2818.1993.tb03335.x
22. E. Lima, L. Wiegart, P. Pernot, M. Howells, J. Timmins, F. Zontone, and A. Madsen, Phys. Rev. Lett. 103, 198102 (2009). PRLTAO 0031-9007 10.1103/PhysRevLett.103.198102
23. X. Huang, J. Nelson, J. Kirz, E. Lima, S. Marchesini, H. Miao, A. M. Neiman, D. Shapiro, J. Steinbrener, A. Stewart, J. J. Turner, and C. Jacobsen, Phys. Rev. Lett. 103, 198101 (2009). PRLTAO 0031-9007 10.1103/PhysRevLett.103.198101
24. R. Dahl and L. A. Staehelin, J. Electron Microsc. Tech. 13, 165 (1989). JEMTEC 0741-0581 10.1002/jemt.1060130305
25. H. Kanno, R. J. Speedy, and C. A. Angell, Science 189, 880 (1975). SCIEAS 0036-8075 10.1126/science.189.4206.880
26. C. U. Kim, Y.-F. Chen, M. W. Tate, and S. M. Gruner, J. Appl. Crystallogr. 41, 1 (2008). JACGAR 0021-8898 10.1107/S0021889807048820
27. J. C. Gilkey and L. A. Staehelin, J. Electron Microsc. Tech. 3, 177 (1986). JEMTEC 0741-0581 10.1002/jemt.1060030206
28. C. U. Kim, R. Kapfer, and S. M. Gruner, Acta Crystallogr. D Biol. Crystallogr. 61, 881 (2005). 0907-4449 10.1107/S090744490500836X
29. P. van der Linden, F. Dobias, H. Vitoux, U. Kapp, J. Jacobs, S. Mc Sweeney, C. Mueller-Dieckmann, and P. Carpentier, J. Appl. Crystallogr. 47, 584 (2014). 1600-5767 10.1107/S1600576714000855
30. C. Ponchut, J. M. Rigal, J. Clément, E. Papillon, A. Homs, and S. Petitdemange, J. Instrum. 6, C01069 (2011). 1748-0221 10.1088/1748-0221/6/01/C01069
31. S. Marchesini, H. He, H. Chapman, S. Hau-Riege, A. Noy, M. Howells, U. Weierstall, and J. Spence, Phys. Rev. B 68, 140101 (2003). PRBMDO 1098-0121 10.1103/PhysRevB.68.140101
32. M. Eltsov and J. Dubochet, J. Bacteriol. 187, 8047 (2005). JOBAAY 0021-9193 10.1128/JB.187.23.8047-8054.2005
33. Electron Tomography-Methods for Three-Dimensional Visualization of Structures in the Cell, 2nd ed., edited by J. Frank (Springer, New York, 2005).
34. S. O. Hruszkewycz, M. V. Holt, C. E. Murray, J. Bruley, J. Holt, A. Tripathi, O. G. Shpyrko, I. McNulty, M. J. Highland, and P. H. Fuoss, Nano Lett. 12, 5148 (2012). NALEFD 1530-6984 10.1021/nl303201w
35. E. Lima, A. Diaz, M. Guizar-Sicairos, S. Gorelick, P. Pernot, T. Schleier, and A. Menzel, J. Microsc. 249, 1 (2013). JMICAR 0022-2720 10.1111/j.1365-2818.2012.03682.x
36. H. Jiang, R. Xu, C.-C. Chen, W. Yang, J. Fan, X. Tao, C. Song, Y. Kohmura, T. Xiao, Y. Wang, Y. Fei, T. Ishikawa, W. L. Mao, and J. Miao, Phys. Rev. Lett. 110, 205501 (2013). PRLTAO 0031-9007 10.1103/PhysRevLett.110.205501