Eliminating deformations in fluorescence emission difference microscopy

Optics Express

Volumn 22, Issue 21, 2014, Pages 26375-26385

  You, Shangting ^a   Kuang, Cuifang ^a   Rong, Zihao ^a   Liu, Xu ^a  

^a ZHEJIANG UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

FIELD EMISSION DISPLAYS; FLUORESCENCE; SIGNAL TO NOISE RATIO;

CONFOCAL IMAGING; FLUORESCENCE EMISSION; FOCAL SPOT; NEGATIVE IMAGE; NEGATIVE VALUES; SUPERIOR RESOLUTION;

DEFORMATION;

FLUORESCENCE; FLUORESCENCE MICROSCOPY; IMAGE PROCESSING; PROCEDURES; SIGNAL NOISE RATIO;

FLUORESCENCE; IMAGE PROCESSING, COMPUTER-ASSISTED; MICROSCOPY, FLUORESCENCE; SIGNAL-TO-NOISE RATIO;

EID: 84908200383     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.22.026375     Document Type: Article

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