Automatic deconvolution in 4Pi-microscopy with variable phase

Optics Express

Volumn 18, Issue 10, 2010, Pages 10154-10167

  Vicidomini, Giuseppe ^a   Schmidt, Roman ^a   Egner, Alexander ^a   Hell, Stefan W ^a   Schönle, Andreas ^a  

^a MAX PLANCK INSTITUTE FOR BIOPHYSICAL CHEMISTRY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

IMAGE RECONSTRUCTION; OPTOELECTRONIC DEVICES; REFRACTIVE INDEX; WAVEFRONTS;

APRIORI; AXIAL RESOLUTIONS; BLIND DECONVOLUTION; COHERENT ADDITION; COUNTERPROPAGATING; EXPERT USERS; FAST METHODS; GHOST IMAGE; IMAGE FORMATION PROCESS; IMAGE RESTORATION; OBJECTIVE LENS; PHASE DIFFERENCE; PHASE FUNCTIONS; SIMULTANEOUS ESTIMATION; SYNTHETIC AND REAL DATA; VARIABLE PHASE;

CONVOLUTION;

ALGORITHM; ARTICLE; COMPUTER ASSISTED DIAGNOSIS; EVALUATION; IMAGE ENHANCEMENT; METHODOLOGY; MICROSCOPY; REPRODUCIBILITY; SENSITIVITY AND SPECIFICITY; THREE DIMENSIONAL IMAGING;

ALGORITHMS; IMAGE ENHANCEMENT; IMAGE INTERPRETATION, COMPUTER-ASSISTED; IMAGING, THREE-DIMENSIONAL; MICROSCOPY; REPRODUCIBILITY OF RESULTS; SENSITIVITY AND SPECIFICITY;

EID: 77952725336     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.18.010154     Document Type: Article

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