Resolution and contrast enhancement in laser scanning microscopy using dark beam imaging

Optics Express

Volumn 21, Issue 13, 2013, Pages 15912-15925

  Dehez, Harold ^a,b   Piché, Michel ^b   De Koninck, Yves ^a  

^a CENTRE DE RECHERCHE DE L INSTITUT UNIVERSITAIRE EN SANTÉ MENTALE DE QUÉBEC   (Canada)

^b UNIVERSITÉ LAVAL   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

OPTICAL CONSTANTS; OPTICS;

COMPLEX OPTICAL SYSTEMS; CONTRAST ENHANCEMENT; DIFFRACTION OF LIGHTS; LASER SCANNING MICROSCOPE; LASER SCANNING MICROSCOPY; RESOLUTION ENHANCEMENT; RESOLUTION IMPROVEMENT; THREE DIMENSIONAL IMAGING;

LASER OPTICS;

EID: 84879956247     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.21.015912     Document Type: Article

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