Resolution enhancement by subtraction of confocal signals taken at different pinhole sizes

Micron

Volumn 34, Issue 6-7, 2003, Pages 293-300

  Heintzmann, Rainer ^a   Sarafis, Vassilios ^d   Munroe, Paul ^b   Nailon, John ^d   Hanley, Quentin S ^a,c   Jovin, Thomas M ^a  

^a MAX PLANCK INSTITUTE FOR BIOPHYSICAL CHEMISTRY   (Germany)

^b UNIVERSITY OF NEW SOUTH WALES   (Australia)

^c UNIVERSITY OF THE WEST INDIES   (Jamaica)

^d NONE

Author keywords

Composite image; Fourier space weighting; Subtractive imaging; Superresolution; Weighted averaging

Indexed keywords

EID: 0141569588     PISSN: 09684328     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0968-4328(03)00054-4     Document Type: Conference Paper

References (14)

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