High-resolution imaging with SEM/T-SEM, EDX and SAM as a combined methodical approach for morphological and elemental analyses of single engineered nanoparticles

RSC Advances

Volumn 4, Issue 91, 2014, Pages 49577-49587

  Rades, Steffi ^a   Hodoroaba, Vasile Dan ^a   Salge, Tobias ^b   Wirth, Thomas ^a   Lobera, M Pilar ^c   Labrador, Roberto Hanoi ^d   Natte, Kishore ^a,e   Behnke, Thomas ^a   Gross, Thomas ^a   Unger, Wolfgang E S ^a  

^a BAM FEDERAL INSTITUTE FOR MATERIALS RESEARCH AND TESTING   (Germany)

^b BRUKER DALTONIK GMBH   (Germany)

^c Instituto de Ciencia de Materiales de Aragón   (Spain)

^d NANOLOGICA AB   (Sweden)

^e LEIBNIZ INSTITUT FÜR KATALYSE E V AN DER UNIVERSITÄT ROSTOCK   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ENGINEERED NANOPARTICLES; HIGH-RESOLUTION IMAGING; METHODICAL APPROACH;

EID: 84908011872     PISSN: None     EISSN: 20462069     Source Type: Journal    
DOI: 10.1039/c4ra05092d     Document Type: Article

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