Investigation of silica nanoparticles by Auger electron spectroscopy (AES)

Surface and Interface Analysis

Volumn 46, Issue 10-11, 2014, Pages 952-956

  Rades, S ^a   Wirth, T ^a   Unger, W ^a  

^a BAM FEDERAL INSTITUTE FOR MATERIALS RESEARCH AND TESTING   (Germany)

Author keywords

Auger electron spectroscopy; Nanoparticles; Surface analysis

Indexed keywords

AUGERS; INDUSTRIAL RESEARCH; LUNAR SURFACE ANALYSIS; NANOPARTICLES; OXIDE MINERALS; SILICA; SILICA NANOPARTICLES; SURFACE ANALYSIS; TITANIUM DIOXIDE;

AUGER ELECTRON SPECTROSCOPIES (AES); INDUSTRIAL SOURCES; LINE SCAN; METHODOLOGICAL ASPECTS;

AUGER ELECTRON SPECTROSCOPY;

EID: 84908159426     PISSN: 01422421     EISSN: 10969918     Source Type: Journal    
DOI: 10.1002/sia.5378     Document Type: Article

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