What remains to be done to allow quantitative X-Ray microanalysis performed with EDS to become a true characterization technique?

Microscopy and Microanalysis

Volumn 18, Issue 5, 2012, Pages 915-940

  Gauvin, Raynald ^a  

^a MCGILL UNIVERSITY   (Canada)

Author keywords

Auger electrons; Coster Kronig transition factors; electron microscopy; fast secondary electrons; ionization cross sections; Monte Carlo simulations; spatial resolution; X ray microanalysis

Indexed keywords

EID: 84868564634     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927612001468     Document Type: Review

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