Improved broadband antireflection in Schottky-like junction of conformal Al-doped ZnO layer on chemically textured Si surfaces

Applied Physics Letters

Volumn 105, Issue 12, 2014, Pages

  Saini, C P ^a   Barman, A ^a   Kumar, M ^b   Sahoo, P K ^c   Som, T ^b   Kanjilal, A ^a  

^a SHIV NADAR UNIVERSITY   (India)

^b INSTITUTE OF PHYSICS   (India)

^c NATIONAL INSTITUTE OF SCIENCE EDUCATION AND RESEARCH   (India)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION SPECTROSCOPY; II-VI SEMICONDUCTORS; OXIDE MINERALS; REFLECTION; TEXTURES; X RAY DIFFRACTION ANALYSIS; ZINC OXIDE;

BROADBAND ANTI REFLECTIONS; CONFORMAL GROWTH; ELECTRICAL CONDUCTIVITY; HETEROSTRUCTURE DEVICES; POLYCRYSTALLINE; PYRAMIDAL STRUCTURES; SPECULAR REFLECTANCE; TEXTURED SURFACE;

SILICON;

EID: 84907494945     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4896340     Document Type: Article

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