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Volumn 35, Issue 8, 2014, Pages 2277-2280

The molecular structures of poly(3-hexylthiophene) films determine the contact properties at the electrode/semiconductor interface

Author keywords

Contact resistance; Metal penetration; Organic transistor; Transfer line method

Indexed keywords

CARRIER MOBILITY; CONTACT RESISTANCE; GOLD; HEAT TREATMENT; SEMICONDUCTOR DEVICES;

EID: 84906336015     PISSN: 02532964     EISSN: 12295949     Source Type: Journal    
DOI: 10.5012/bkcs.2014.35.8.2277     Document Type: Article
Times cited : (9)

References (29)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.