Joining of broken multiwalled carbon nanotubes using an electron beam-induced deposition (EBID) technique

Journal of Electronic Materials

Volumn 43, Issue 9, 2014, Pages 3283-3289

  Dhall, Shivani ^a   Vaidya, Gayatri ^b   Jaggi, Neena ^a  

^a NATIONAL INSTITUTE OF TECHNOLOGY   (India)

^b INDIAN INSTITUTE OF TECHNOLOGY BOMBAY   (India)

Author keywords

EBID technique; Functionalization; I V characteristics; photolithography

Indexed keywords

DEPOSITION; ELECTRON BEAMS; MULTIWALLED CARBON NANOTUBES (MWCN); OHMIC CONTACTS; PHOTOLITHOGRAPHY; PLATINUM; REPAIR; SCANNING ELECTRON MICROSCOPY; TUBES (COMPONENTS);

CURRENT-VOLTAGE MEASUREMENTS; EBID TECHNIQUE; ELECTRON BEAM-INDUCED DEPOSITION; FUNCTIONALIZATIONS; IV CHARACTERISTICS; MULTIWALLED CARBON NANOTUBE (MWCNTS); SCANNING ELECTRON MICROSCOPY IMAGE; THREE-DIMENSIONAL (3D) NANOSTRUCTURES;

JOINING;

EID: 84906313147     PISSN: 03615235     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11664-014-3230-2     Document Type: Article

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