Size effect on the short range order and the crystallization of nanosized amorphous alumina

Crystal Growth and Design

Volumn 14, Issue 8, 2014, Pages 3983-3989

  Bloch, Leonid ^a   Kauffmann, Yaron ^a   Pokroy, Boaz ^a  

^a TECHNION ISRAEL INSTITUTE OF TECHNOLOGY   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINA; AMORPHOUS MATERIALS; ATOMIC LAYER DEPOSITION; CRYSTALLINE MATERIALS; ELECTRON ENERGY LOSS SPECTROSCOPY; SIZE DETERMINATION; X RAY PHOTOELECTRON SPECTROSCOPY;

AMORPHOUS ALUMINA; AMORPHOUS MINERALS; AMORPHOUS TO CRYSTALLINE TRANSFORMATION; CRYSTALLINE PHASE TRANSITION; CRYSTALLIZATION TEMPERATURE; DIRECT MEASUREMENT; RELATIVE STABILITIES; SHORT RANGE ORDERING;

AMORPHOUS FILMS;

EID: 84905711218     PISSN: 15287483     EISSN: 15287505     Source Type: Journal    
DOI: 10.1021/cg500580c     Document Type: Article

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