Clean surface processing of rubrene single crystal immersed in ionic liquid by using frequency modulation atomic force microscopy

Applied Physics Letters

Volumn 104, Issue 26, 2014, Pages

  Yokota, Yasuyuki ^a   Hara, Hisaya ^a   Morino, Yusuke ^a   Bando, Ken Ichi ^a   Imanishi, Akihito ^a   Uemura, Takafumi ^a,b   Takeya, Jun ^a,b   Fukui, Ken Ichi ^a  

^a OSAKA UNIVERSITY   (Japan)

^b UNIVERSITY OF TOKYO   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRYSTAL STRUCTURE; DISSOLUTION; IONIC LIQUIDS; SINGLE CRYSTALS;

CLEAN SURFACES; CRYSTAL INTERFACES; ELECTRIC DOUBLE LAYER; FREQUENCY MODULATION ATOMIC FORCE MICROSCOPY; INTERMOLECULAR INTERACTIONS; LOW-VOLTAGE TRANSISTORS; MOLECULAR RESOLUTION; SURFACE PROCESSING;

FREQUENCY MODULATION;

EID: 84905656650     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4886154     Document Type: Article

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