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Applied Physics Letters

Volumn 95, Issue 9, 2009, Pages

High-resolution molecular images of rubrene single crystals obtained by frequency modulation atomic force microscopy

(5) Minato, Taketoshi a Aoki, Hiroto a Fukidome, Hirokazu a Wagner, Thorsten b,c Itaya, Kingo a

a TOHOKU UNIVERSITY (Japan)

b UNIVERSITY OF DUISBURG ESSEN (Germany)

c JOHANNES KEPLER UNIVERSITY LINZ (Austria)

Author keywords

[No Author keywords available]

Indexed keywords

AFM; BULK CRYSTALS; EXPERIMENTAL ERRORS; FREQUENCY MODULATION ATOMIC FORCE MICROSCOPY; HIGH RESOLUTION; INTERNAL STRUCTURE; LATTICE PARAMETERS; MOLECULAR IMAGES; MOLECULAR PACKINGS; RUBRENES; UNIT CELLS;

ATOMIC FORCE MICROSCOPY; CELL MEMBRANES; CRYSTAL ATOMIC STRUCTURE; FREQUENCY MODULATION; SOIL CONSERVATION; SURFACE STRUCTURE; VACUUM;

SINGLE CRYSTALS;

EID: 69949134007 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.3184770 Document Type: Article

Times cited : (19)

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