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Volumn , Issue , 2014, Pages 281-284

Equivalent circuit model for the switching conduction characteristics of TiO2-based MIM structures

Author keywords

[No Author keywords available]

Indexed keywords

METAL INSULATOR BOUNDARIES; MICROELECTRONICS; TITANIUM DIOXIDE;

EID: 84904616989     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/MIEL.2014.6842143     Document Type: Conference Paper
Times cited : (2)

References (10)
  • 1
    • 67650102619 scopus 로고    scopus 로고
    • Redox-based resistive switching memories-Nanoionic mechanisms, prospects, and challenges
    • R. Waser, R. Ditmann, G. Staikov, K. Szot, Redox-based resistive switching memories-Nanoionic mechanisms, prospects, and challenges, Adv Mat 21, pp. 2632-2663 (2009)
    • (2009) Adv Mat , pp. 2632-2663
    • Waser, R.1    Ditmann, R.2    Staikov, G.3    Szot, K.4
  • 2
    • 67649133369 scopus 로고    scopus 로고
    • Mechanism for bipolar switching in a Pt/TiO2/Pt resistive switching cell
    • D. Jeong, H. Schroeder, R. Waser, Mechanism for bipolar switching in a Pt/TiO2/Pt resistive switching cell, Phys Rev B 79, 195317 (2009)
    • (2009) Phys Rev B , vol.79 , pp. 195317
    • Jeong, D.1    Schroeder, H.2    Waser, R.3
  • 3
    • 84863068618 scopus 로고    scopus 로고
    • Oxide-based RRAM: Unified microscopic principle for both unipolar and bipolar switching
    • B. Gao, J. Kang, Y. Chen, et al, Oxide-based RRAM: unified microscopic principle for both unipolar and bipolar switching, IEEE Int Elect Dev Meeting IEDM, pp. 417-420 (2011)
    • (2011) IEEE Int Elect Dev Meeting IEDM , pp. 417-420
    • Gao, B.1    Kang, J.2    Chen, Y.3
  • 4
    • 84866561026 scopus 로고    scopus 로고
    • Dynamic hour glass model for set and reset in HfO2 RRAM
    • R. Degreave, A. Fantini, S. Clima, et al, Dynamic hour glass model for set and reset in HfO2 RRAM, VLSI Tech Dig, pp. 75-76 (2012)
    • (2012) VLSI Tech Dig , pp. 75-76
    • Degreave, R.1    Fantini, A.2    Clima, S.3
  • 5
    • 33645641019 scopus 로고    scopus 로고
    • Individual dislocations in single-crystalline SrTiO3
    • K. Szot, W. Speier, G. Bihlmayer, R. Waser, Individual dislocations in single-crystalline SrTiO3, Nat Mat 5, 312-320 (2006)
    • (2006) Nat Mat , vol.5 , pp. 312-320
    • Szot, K.1    Speier, W.2    Bihlmayer, G.3    Waser, R.4
  • 6
    • 84861720646 scopus 로고    scopus 로고
    • Analysis and modeling of resistive switching statistics
    • S. Long, C. Cagli, D. Ielmini, M. Liu, J. Suñé, Analysis and modeling of resistive switching statistics, J Appl Phys 111, 074508 (2012)
    • (2012) J Appl Phys , vol.111 , pp. 074508
    • Long, S.1    Cagli, C.2    Ielmini, D.3    Liu, M.4    Suñé, J.5
  • 7
    • 0037158578 scopus 로고    scopus 로고
    • Heating in current carrying molecular junctions
    • D. Segal, A. Nitzan, Heating in current carrying molecular junctions, J Chem Phys 117, pp. 3915-3927 (2002)
    • (2002) J Chem Phys , vol.117 , pp. 3915-3927
    • Segal, D.1    Nitzan, A.2
  • 8
    • 0034290965 scopus 로고    scopus 로고
    • Exact analytical solutions of forward non-ideal diode equation with series and shunt parasitic resistances
    • A. Ortiz-Conde, F. Garcia-Sánchez, J. Muci, Exact analytical solutions of forward non-ideal diode equation with series and shunt parasitic resistances. Solid-St Electron 44, pp. 1861-1864 (2000)
    • (2000) Solid-St Electron , vol.44 , pp. 1861-1864
    • Ortiz-Conde, A.1    Garcia-Sánchez, F.2    Muci, J.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.