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Volumn 104, Issue 24, 2014, Pages

Mechanisms of electromechanical coupling in strain based scanning probe microscopy

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROCHEMICAL DEVICES; ELECTROMECHANICAL COUPLING; FERROELECTRIC MATERIALS; FUNCTIONAL MATERIALS; HYDROPHOBICITY; SCANNING PROBE MICROSCOPY; SPECTROSCOPIC ANALYSIS;

EID: 84903161439     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4884422     Document Type: Article
Times cited : (149)

References (20)
  • 9
    • 84874447347 scopus 로고    scopus 로고
    • 10.1021/nn305648j
    • J. Zhu, L. Lu, and K. Y. Zeng, ACS Nano 7, 1666 (2013). 10.1021/nn305648j
    • (2013) ACS Nano , vol.7 , pp. 1666
    • Zhu, J.1    Lu, L.2    Zeng, K.Y.3
  • 12
    • 85085221450 scopus 로고    scopus 로고
    • Electrochemical Strain Microscopy of Silica Glasses
    • (in press)
    • R. Proksch, "Electrochemical Strain Microscopy of Silica Glasses," J. Appl. Phys. (in press).
    • J. Appl. Phys.
    • Proksch, R.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.