Measurement of in-plane thermal conductivity of ultrathin films using micro-Raman spectroscopy

Nanoscale and Microscale Thermophysical Engineering

Volumn 18, Issue 2, 2014, Pages 183-193

  Luo, Zhe ^a   Liu, Han ^b   Spann, Bryan T ^a   Feng, Yanhui ^c   Ye, Peide ^b   Chen, Yong P ^b   Xu, Xianfan ^a  

^a PURDUE UNIVERSITY   (United States)

^b Purdue University   (United States)

^c UNIVERSITY OF SCIENCE AND TECHNOLOGY BEIJING   (China)

Author keywords

In plane thermal conductivity; Micro Raman; Phonon boundary scattering; Thin films

Indexed keywords

AMORPHOUS FILMS; GRAIN BOUNDARIES; MATERIALS PROPERTIES; PHONONS; RAMAN SPECTROSCOPY; SCATTERING; SUBSTRATES; TEMPERATURE SENSORS; THIN FILMS; ULTRATHIN FILMS;

IN-PLANE LATTICES; MICRO RAMAN SPECTROSCOPY; MICRO-RAMAN; PHONON-BOUNDARY SCATTERING; SUBSTRATE MATERIAL; SURFACE/INTERFACE; THERMAL CONDUCTIVITY MODEL; THIN-FILM STRUCTURE;

THERMAL CONDUCTIVITY OF SOLIDS;

EID: 84902782508     PISSN: 15567265     EISSN: None     Source Type: Journal    
DOI: 10.1080/15567265.2014.892553     Document Type: Article

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