Uncertainty quantification in remaining useful life prediction using first-order reliability methods

IEEE Transactions on Reliability

Volumn 63, Issue 2, 2014, Pages 603-619

  Sankararaman, Shankar ^a   Daigle, Matthew J ^a   Goebel, Kai ^a  

^a NASA AMES RESEARCH CENTER   (United States)

Author keywords

Analytical algorithms; first order reliability method; ithium ion battery; model based prognostics; probability distribution; remaining useful life; uncertainty

Indexed keywords

APPROXIMATION ALGORITHMS; DECISION MAKING; FORECASTING; METHOD OF MOMENTS; PROBABILITY DISTRIBUTIONS; RISK ASSESSMENT; STRUCTURAL ANALYSIS; UNCERTAINTY ANALYSIS;

ANALYTICAL ALGORITHMS; FIRST ORDER RELIABILITY METHODS; ITHIUM-ION BATTERY; MODEL-BASED PROGNOSTICS; REMAINING USEFUL LIVES; UNCERTAINTY;

APPLICATIONS;

EID: 84902109793     PISSN: 00189529     EISSN: None     Source Type: Journal    
DOI: 10.1109/TR.2014.2313801     Document Type: Article

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