Uncertainty assessment of prognostics of electronics subject to random vibration

AAAI Fall Symposium - Technical Report

Volumn , Issue , 2007, Pages 50-57

  Gu, Jie ^a   Barker, Donald ^a   Pecht, Michael ^a  

^a UNIVERSITY OF MARYLAND   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ACCUMULATED DAMAGES; CASE STUDIES; CONFIDENCE INTERVALS; DOMINANT INPUTS; ELECTRONIC CIRCUIT BOARDS; FAILURE CRITERIONS; FAILURE TIMES; INPUT PARAMETERS; MEASUREMENT UNCERTAINTIES; MODEL OUTPUTS; MONTE CARLO SIMULATIONS; PARAMETER UNCERTAINTIES; PROGNOSTIC ANALYSES; RANDOM VIBRATIONS; REMAINING LIVES; UNCERTAINTY ASSESSMENTS; UNCERTAINTY SOURCES;

ARTIFICIAL INTELLIGENCE; ELECTRON TUBES; IMAGE SEGMENTATION; MONTE CARLO METHODS; NETWORKS (CIRCUITS); PAPER; QUALITY ASSURANCE; RANDOM PROCESSES; SENSITIVITY ANALYSIS;

UNCERTAINTY ANALYSIS;

EID: 58349098139     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (16)

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