Uncertainty management in shock models applied to prognostic problems

AAAI Fall Symposium - Technical Report

Volumn , Issue , 2007, Pages 136-143

  Usynin, Alexander ^a   Wesley Hines, J ^a  

^a University of Tennessee

Author keywords

[No Author keywords available]

Indexed keywords

DEGRADATION DATUMS; FAILURE MECHANISMS; INDICATOR VALUES; NUMERICAL EXAMPLES; PREDICTIVE ACCURACIES; RELIABILITY MODELS; SHOCK MODELS; UNCERTAINTY EFFECTS; UNCERTAINTY MANAGEMENTS; UNOBSERVABLE;

ARTIFICIAL INTELLIGENCE; RELIABILITY;

DEGRADATION;

EID: 58349116830     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (12)

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11. Vichare, N.M., and Pecht, M.G. 2006, Prognostics and Health Management of Electronics, IEEE Trans, on Components and Packaging Technologies, 29(1), pp.222-229
12. Usynin, A.V., and Hines, J.W., and Urmanov, A.M. 2008, Uncertain Failure Thresholds in Cumulative Damage Models, Forthcoming.