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Volumn 25, Issue 24, 2014, Pages

Electronic confinement in graphene ruled by N doped extended defects

Author keywords

DFT; electronic confinement; extended defects; grapheme

Indexed keywords

ELECTRONIC PROPERTIES; GRAIN BOUNDARIES; GRAPHENE; HETEROJUNCTIONS;

EID: 84901650396     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/25/24/245706     Document Type: Article
Times cited : (5)

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