Linking Interfacial Step Structure and Chemistry with Locally Enhanced Radiation-Induced Amorphization at Oxide Heterointerfaces

Advanced Materials Interfaces

Volumn 1, Issue 4, 2014, Pages

  Aguiar, Jeffery A ^a   Dholabhai, Pratik P ^a   Bi, Zhenxing ^b   Jia, Quanxi ^b   Fu, Engang G ^a   Wang, Yongqiang Q ^a   Aoki, Toshihiro ^c   Zhu, Jiangtao ^c,d   Misra, Amit ^b   Uberuaga, Blas P ^a  

^a LOS ALAMOS NATIONAL LABORATORY   (United States)

^b LOS ALAMOS NATIONAL LABORATORY   (United States)

^c ARIZONA STATE UNIVERSITY   (United States)

^d Arizona State University   (United States)

Author keywords

Composites; EELS; Oxides; Radiation Damage; STEM

Indexed keywords

AMORPHIZATION; CERIUM OXIDE; COMPOSITE MATERIALS; DEFECTS; ELECTRON ENERGY LOSS SPECTROSCOPY; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; ION BOMBARDMENT; NANOSTRUCTURED MATERIALS; OXIDES; RADIATION DAMAGE; STEM (SCIENCE, TECHNOLOGY, ENGINEERING AND MATHEMATICS); STRONTIUM TITANATES; TITANIUM COMPOUNDS; TRANSMISSION ELECTRON MICROSCOPY;

DAMAGE ACCUMULATION; INTERFACIAL ATOMIC STRUCTURE; INTERNAL INTERFACES; RADIATION INDUCED DEFECTS; RADIATION TOLERANT; RADIATION-INDUCED; RADIATION-INDUCED EFFECTS; RECOMBINATION CENTERS;

INTERFACES (MATERIALS);

EID: 84901498583     PISSN: None     EISSN: 21967350     Source Type: Journal    
DOI: 10.1002/admi.201300142     Document Type: Article

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