Defect and transport properties of nanocrystalline CeO2-x

Applied Physics Letters

Volumn 69, Issue 2, 1996, Pages 185-187

  Chiang, Y M ^a,b   Lavik, E B ^a,b   Kosacki, I ^a,b,c   Tuller, H L ^a,b   Ying, J Y ^a,b  

^a MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

^b Dept of Mat Sci and Engineering ^*

^c MISSOURI UNIVERSITY OF SCIENCE AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001165983     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.117366     Document Type: Article

References (18)

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