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Volumn 89, Issue 20, 2014, Pages

Stability and electronic structures of native defects in single-layer MoS2

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Indexed keywords


EID: 84901453714     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.89.205417     Document Type: Article
Times cited : (310)

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