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Volumn 86, Issue 4, 2012, Pages

Finite-size supercell correction schemes for charged defect calculations

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EID: 84863833798     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.86.045112     Document Type: Article
Times cited : (432)

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