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Volumn 26, Issue 18, 2014, Pages 2889-2893

AFM imaging of molecular spin-state changes through quantitative thermomechanical measurements

(8) Hernández, Edna M a Quintero, Carlos M b Kraieva, Olena a,c Thibault, Christophe b Bergaud, Christian b Salmon, Lionel a Molnár, Gábor a Bousseksou, Azzedine a

a LCC LABORATOIRE DE CHIMIE DE COORDINATION (France)

b UNIVERSITÉ PAUL SABATIER (France)

c NATIONAL TECHNICAL UNIVERSITY OF UKRAINE (Ukraine)

Author keywords

atomic force microscopy; microwire heaters; nanomechanical properties; spin crossover; thin films

Indexed keywords

ATOMIC FORCE MICROSCOPY; IMAGE RECONSTRUCTION; THIN FILMS;

HIGH-RESOLUTION IMAGING; MICROWIRE; NANOMECHANICAL PROPERTY; SPIN CROSSOVERS; SPIN STATE TRANSITION; SPIN-STATE CHANGES; THERMOMECHANICAL MEASUREMENTS; YOUNG'S MODULUS;

ELASTIC MODULI;

EID: 84899997111 PISSN: 09359648 EISSN: 15214095 Source Type: Journal
DOI: 10.1002/adma.201305539 Document Type: Article

Times cited : (27)

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