On the use of peak-force tapping atomic force microscopy for quantification of the local elastic modulus in hardened cement paste

Cement and Concrete Research

Volumn 42, Issue 1, 2012, Pages 215-221

  Trtik, Pavel ^a   Kaufmann, Josef ^a   Volz, Udo ^b  

^a SWISS FEDERAL LABORATORIES FOR MATERIALS SCIENCE AND TECHNOLOGY   (Switzerland)

^b BRUKER DALTONIK GMBH   (Germany)

Author keywords

Atomic force microscopy (B); Elastic moduli (C); Image analysis (B); Microstructure (B)

Indexed keywords

BACKSCATTERED ELECTRON IMAGING; BACKSCATTERED ELECTRONS; CEMENT PASTE; ENERGY DISPERSIVE X-RAY SPECTROSCOPY; FOCUSSED ION BEAM MILLINGS; HARDENED CEMENT PASTE; IMAGING MODES; LOCAL DISTRIBUTIONS; MICROSTRUCTURE (B); NANOMECHANICAL MAPPINGS; NANOMECHANICAL PROPERTY; QUANTITATIVE MAPPING; SPATIAL RESOLUTION; YOUNG'S MODULUS;

ATOMIC FORCE MICROSCOPY; CEMENTS; ELECTRON OPTICS; ELECTRON SCATTERING; ENERGY DISPERSIVE SPECTROSCOPY; HARDENING; MAPPING; MICROSTRUCTURE; SURFACE ROUGHNESS;

ELASTIC MODULI;

EID: 80855132786     PISSN: 00088846     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.cemconres.2011.08.009     Document Type: Article

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