Measuring the electronic corrugation at the metal/organic interface

Physical Review B - Condensed Matter and Materials Physics

Volumn 89, Issue 15, 2014, Pages

  Caplins, Benjamin W ^a,b   Shearer, Alex J ^a,b   Suich, David E ^a,b   Muller, Eric A ^a,b   Harris, Charles B ^a,b  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84899715332     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.89.155422     Document Type: Article

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