Interfacial susceptibilities in nanoplasmonics via inversion of Fresnel coefficients

Plasmonics

Volumn 9, Issue 2, 2014, Pages 261-272

  Lazzari, Rémi ^a   Simonsen, Ingve ^b   Jupille, Jacques ^a  

^a INSTITUT DES NANOSCIENCES DE PARIS   (France)

^b NORWEGIAN UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Norway)

Author keywords

Dielectric constant; Film; Interface susceptibilities; Nanoparticles; Plasmon; Polarizability; Surface differential reflectivity spectroscopy

Indexed keywords

EID: 84898068600     PISSN: 15571955     EISSN: 15571963     Source Type: Journal    
DOI: 10.1007/s11468-013-9619-6     Document Type: Article

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