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Applied Physics Letters

Volumn 100, Issue 5, 2012, Pages

Optical detection of melting point depression for silver nanoparticles via in situ real time spectroscopic ellipsometry

(4) Little, S A a Begou, T b Collins, R W a Marsillac, S b

a UNIVERSITY OF TOLEDO (United States)

b Old Dominion University (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AS-DEPOSITED FILMS; DIELECTRIC FUNCTIONS; IN-SITU; INTER-BAND TRANSITION; LORENTZ; MELTING POINT DEPRESSIONS; NANOPARTICLE DIAMETER; OPTICAL DETECTION; OSCILLATOR PARAMETERS; PHYSICAL THICKNESS; PLASMON-POLARITONS; REAL TIME SPECTROSCOPIC ELLIPSOMETRY; ROOM TEMPERATURE; SILVER NANOPARTICLES; SURFACE ENERGY DENSITY;

MELTING POINT; NANOPARTICLES; SPECTROSCOPIC ELLIPSOMETRY;

SILVER;

EID: 84856989694 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.3681367 Document Type: Article

Times cited : (51)

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