Quantitative analysis of nanoparticle growth through plasmonics

Nanotechnology

Volumn 22, Issue 44, 2011, Pages

  Lazzari, Rémi ^a   Jupille, Jacques ^a  

^a INSTITUT DES NANOSCIENCES DE PARIS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

FINITE SIZE EFFECT; FLEXIBLE TOOL; FRESNEL REFLECTION COEFFICIENT; IN-SITU; LINE SHAPE; METAL DIELECTRICS; METAL NANOPARTICLES; NANOPARTICLE GROWTHS; OPTICAL PROFILES; PARTICLE SHAPE; PHYSICAL MEANINGS; PLASMON EXCITATIONS; PLASMONIC RESPONSE; PLASMONICS; POLARIZABILITIES; QUANTITATIVE STUDY; QUASISTATIC APPROXIMATIONS; REAL TIME; STICKING PROBABILITY; SURFACE DIFFERENTIALS; THERMAL VARIATION; UV-VISIBLE;

ASPECT RATIO; CONVOLUTION; MODELS; NANOPARTICLES; PLASMONS; PRECIOUS METALS; REFLECTION;

METAL ANALYSIS;

EID: 80054885083     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/22/44/445703     Document Type: Article

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