Determination of model-free Kramers-Kronig consistent optical constants of thin absorbing films from just one spectral measurement: Application to organic semiconductors

Physical Review B - Condensed Matter and Materials Physics

Volumn 70, Issue 19, 2004, Pages 1-14

  Nitsche, Robert ^a   Fritz, Torsten ^a  

^a DRESDEN UNIVERSITY OF TECHNOLOGY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

GOLD; MICA;

ABSORPTION INDEX; ALGORITHM; ARTICLE; CALCULATION; DIFFERENTIAL REFLECTANCE SPECTRA; FILM; KRAMER KRONIG TRANSFORMATION; MATHEMATICAL ANALYSIS; PARAMETER; REFRACTION INDEX; SEMICONDUCTOR; SPECTROSCOPY; SPECTRUM;

EID: 12344313950     PISSN: 01631829     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevB.70.195432     Document Type: Article

References (23)

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