Ferromagnetism and impurity band in a magnetic semiconductor: InMnP

Physical Review B - Condensed Matter and Materials Physics

Volumn 89, Issue 12, 2014, Pages

  Khalid, M ^a   Weschke, Eugen ^b   Skorupa, W ^a   Helm, M ^a,c   Zhou, Shengqiang ^a  

^a INSTITUTE OF ION BEAM PHYSICS AND MATERIALS RESEARCH   (Germany)

^b HAHN MEITNER INSTITUT   (Germany)

^c DRESDEN UNIVERSITY OF TECHNOLOGY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84897878863     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.89.121301     Document Type: Article

References (36)

1. H. Ohno, D. Chiba, F. Matsukura, T. Omiya, E. Abe, T. Dietl, Y. Ohno, and K. Ohtani, Nature (London) 408, 944 (2000). NATUAS 0028-0836 10.1038/35050040
2. D. Chiba, M. Sawicki, Y. Nishitani, Y. Nakatani, F. Matsukura, and H. Ohno, Nature (London) 455, 515 (2008). NATUAS 0028-0836 10.1038/nature07318
3. M. Watanabe, J. Okabayashi, H. Toyao, T. Yamaguchi, and J. Yoshino, Appl. Phys. Lett. 92, 082506 (2008). APPLAB 0003-6951 10.1063/1.2841703
4. A. MacDonald, P. Schiffer, and N. Samarth, Nat. Mater. 4, 195 (2005). 1476-1122 10.1038/nmat1325
5. Y. Nishitani, D. Chiba, M. Endo, M. Sawicki, F. Matsukura, T. Dietl, and H. Ohno, Phys. Rev. B 81, 045208 (2010). PRBMDO 1098-0121 10.1103/PhysRevB.81. 045208
6. K. Hirakawa, S. Katsumoto, T. Hayashi, Y. Hashimoto, and Y. Iye, Phys. Rev. B 65, 193312 (2002). PRBMDO 0163-1829 10.1103/PhysRevB.65.193312
7. K. S. Burch, D. B. Shrekenhamer, E. J. Singley, J. Stephens, B. L. Sheu, R. K. Kawakami, P. Schiffer, N. Samarth, D. D. Awschalom, and D. N. Basov, Phys. Rev. Lett. 97, 087208 (2006). PRLTAO 0031-9007 10.1103/PhysRevLett.97.087208
8. K. Ando, H. Saito, K. C. Agarwal, M. C. Debnath, and V. Zayets, Phys. Rev. Lett. 100, 067204 (2008). PRLTAO 0031-9007 10.1103/PhysRevLett.100.067204
9. L. P. Rokhinson, Y. Lyanda-Geller, Z. Ge, S. Shen, X. Liu, M. Dobrowolska, and J. K. Furdyna, Phys. Rev. B 76, 161201 (2007). PRBMDO 1098-0121 10.1103/PhysRevB.76.161201
10. S. Ohya, K. Takata, and M. Tanaka, Nat. Phys. 7, 342 (2011). 1745-2473 10.1038/nphys1905
11. J. Mašek, F. Máca, J. Kudrnovský, O. Makarovsky, L. Eaves, R. Campion, K. Edmonds, A. Rushforth, C. Foxon, B. Gallagher, Phys. Rev. Lett. 105, 227202 (2010). PRLTAO 0031-9007 10.1103/PhysRevLett.105.227202
12. N. Smarth, Nat. Mater. 11, 360 (2012). 1476-1122 10.1038/nmat3317
13. M. Dobrowolska, K. Tivakornsasithorn, X. Liu, J. Furdyna, M. Berciu, K. Yu, and W. Walukiewicz, Nat. Mater. 11, 444 (2012). 1476-1122 10.1038/nmat3250
14. M. A. Scarpulla, B. L. Cardozo, R. Farshchi, W. M. H. Oo, M. D. McCluskey, K. M. Yu, and O. D. Dubon, Phys. Rev. Lett. 95, 207204 (2005). PRLTAO 0031-9007 10.1103/PhysRevLett.95.207204
15. B. Clerjaud, J. Phys. C: Solid State Phys. 18, 3615 (1985). JPSOAW 0022-3719 10.1088/0022-3719/18/19/005
16. T. Dietl, H. Ohno, F. Matsukura, J. Cibert, and D. Ferrand, Science 287, 1019 (2000). SCIEAS 0036-8075 10.1126/science.287.5455.1019
17. Y. Shon, I. Yoon, S. Lee, H. Jeon, Y. Kwon, T. Kang, C. Park, and H. Kim, J. Korean Phys. Soc. 61, 1292 (2012). KPSJAS 0374-4884 10.3938/jkps.61.1292
18. Y. Shon, S. Lee, I. Yoon, T. Kang, Y. Lee, D. Kim, C. Yoon, and C. Park, J. Korean Phys. Soc. 61, 1065 (2012). KPSJAS 0374-4884 10.3938/jkps.61.1065
19. I. Bucsa, R. Cochrane, and S. Roorda, J. Appl. Phys. 107, 073912 (2010). JAPIAU 0021-8979 10.1063/1.3357381
20. Y. Shon, H. Jeon, S. Lee, C. Park, E. Kim, D. Fu, X. Fan, C. Yoon, and J. Lee, Mater. Sci. Eng. B 146, 220 (2008). MSBTEK 0921-5107 10.1016/j.mseb.2007. 07.093
21. T. Dietl, Semicond. Sci. Technol 17, 377 (2002). SSTEET 0268-1242 10.1088/0268-1242/17/4/310
22. S. Zhou, Y. Wang, Z. Jiang, E. Weschke, and M. Helm, Appl. Phys. Express 5, 093007 (2012). 1882-0778 10.1143/APEX.5.093007
23. A. Rushforth, M. Wang, N. Farley, R. Campion, K. Edmonds, C. Staddon, C. Foxon, and B. Gallagher, J. Appl. Phys. 104, 073908 (2008). JAPIAU 0021-8979 10.1063/1.2991355
24. C. Fritzsche and W. Rothemund, Appl. Phys. 7, 39 (1975). APHYCC 0340-3793 10.1007/BF00900518
25. M. Scarpulla, R. Farshchi, P. Stone, R. Chopdekar, K. Yu, Y. Suzuki, and O. Dubon, J. Appl. Phys. 103, 073913 (2008). JAPIAU 0021-8979 10.1063/1.2890411
26. G. Bouzerar, T. Ziman, and J. Kudrnovský, Phys. Rev. B 72, 125207 (2005). PRBMDO 1098-0121 10.1103/PhysRevB.72.125207
27. T. Schallenberg and H. Munekata, Appl. Phys. Lett. 89, 042507 (2006). APPLAB 0003-6951 10.1063/1.2236210
28. G. Schütz, W. Wagner, W. Wilhelm, P. Kienle, R. Zeller, R. Frahm, and G. Materlik, Phys. Rev. Lett. 58, 737 (1987). PRLTAO 0031-9007 10.1103/PhysRevLett.58.737
29. K. W. Edmonds, N. R. S. Farley, R. P. Campion, C. T. Foxon, B. L. Gallagher, T. K. Johal, G. van der Laan, M. MacKenzie, J. N. Chapman, and E. Arenholz, Appl. Phys. Lett. 84, 4065 (2004). APPLAB 0003-6951 10.1063/1.1751619
30. P. R. Stone, M. A. Scarpulla, R. Farshchi, I. D. Sharp, E. E. Haller, O. D. Dubon, K. M. Yu, J. W. Beeman, E. Arenholz, J. D. Denlinger, Appl. Phys. Lett. 89, 012504 (2006). APPLAB 0003-6951 10.1063/1.2219713
31. B. T. Thole, P. Carra, F. Sette, and G. van der Laan, Phys. Rev. Lett. 68, 1943 (1992). PRLTAO 0031-9007 10.1103/PhysRevLett.68.1943
32. W. L. O'Brien and B. P. Tonner, Phys. Rev. B 50, 12672 (1994). PRBMDO 0163-1829 10.1103/PhysRevB.50.12672
33. F. Matsukura, H. Ohno, A. Shen, and Y. Sugawara, Phys. Rev. B 57, R2037 (1998). PRBMDO 0163-1829 10.1103/PhysRevB.57.R2037
34. A. Kaminski and S. Das Sarma, Phys. Rev. B 68, 235210 (2003). PRBMDO 0163-1829 10.1103/PhysRevB.68.235210
35. A. Van Esch, L. Van Bockstal, J. De Boeck, G. Verbanck, A. S. van Steenbergen, P. J. Wellmann, B. Grietens, R. Bogaerts, F. Herlach, and G. Borghs, Phys. Rev. B 56, 13103 (1997). PRBMDO 0163-1829 10.1103/PhysRevB.56. 13103
36. C. M. Hurd, The Hall Effect and its Application (Plenum, New York, 1980), pp. 1-54.