Understanding nanorheology and surface forces of confined thin films

Korea Australia Rheology Journal

Volumn 26, Issue 1, 2014, Pages 3-14

  Huang, Jun ^a   Yan, Bin ^a   Faghihnejad, Ali ^a   Xu, Haolan ^b   Zeng, Hongbo ^a  

^a UNIVERSITY OF ALBERTA   (Canada)

^b UNIVERSITY OF SOUTH AUSTRALIA   (Australia)

Author keywords

Atomic force microscope (AFM); Nanorheology; Surface forces; Surface forces apparatus (SFA)

Indexed keywords

EID: 84897805667     PISSN: 1226119X     EISSN: 20937660     Source Type: Journal    
DOI: 10.1007/s13367-014-0002-8     Document Type: Review

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