New SFA techniques for studying surface forces and thin film patterns induced by electric fields

Langmuir

Volumn 24, Issue 4, 2008, Pages 1173-1182

  Zeng, Hongbo ^a   Tian, Yu ^a,b   Anderson, Travers H ^a   Tirrell, Matthew ^a   Israelachvili, Jacob N ^a  

^a University of California   (United States)

^b TSINGHUA UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

SURFACE FORCES APPARATUS (SFA); ZEOLITE PARTICLES;

CONDUCTIVE MATERIALS; ELECTRIC FIELDS; ELECTRODES; MICA; SURFACE PROPERTIES;

THIN FILMS;

EID: 40449134885     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la7017242     Document Type: Article

References (65)