Evolution of optical properties of tin film from solid to liquid studied by spectroscopic ellipsometry and ab initio calculation

Applied Physics Letters

Volumn 104, Issue 12, 2014, Pages

  Zhang, D X ^a   Shen, B ^a   Zheng, Y X ^a   Wang, S Y ^a,b,c   Zhang, J B ^a   Yang, S D ^a   Zhang, R J ^a   Chen, L Y ^a   Wang, C Z ^c   Ho, K M ^c  

^a FUDAN UNIVERSITY   (China)

^b Key Laboratory for Information Science of Electromagnetic Waves (MoE)   (China)

^c IOWA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CALCULATIONS; METALLIC FILMS; MOLECULAR DYNAMICS; OPTICAL DATA PROCESSING; OPTICAL PROPERTIES; SPECTROSCOPIC ELLIPSOMETRY; TIN;

AB INITIO CALCULATIONS; AB INITIO MOLECULAR DYNAMICS SIMULATION; DIELECTRIC FUNCTIONS; FIRST-PRINCIPLES CALCULATION; INTER-BAND TRANSITION; LOCAL STRUCTURE; OPTICAL MEASUREMENT; TEMPERATURE DEPENDENT;

LIQUIDS;

EID: 84897454861     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4869722     Document Type: Article

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