Measuring the loss tangent of polymer materials with atomic force microscopy based methods

Measurement Science and Technology

Volumn 25, Issue 5, 2014, Pages

  Yablon, Dalia G ^a,b   Grabowski, Jean ^a   Chakraborty, Ishita ^a  

^a EXXONMOBIL UPSTREAM RESEARCH COMPANY   (United States)

^b SurfaceChar LLC   (United States)

Author keywords

nanomechanical; scanning probe microscopy; viscoelastic property

Indexed keywords

AMPLITUDE MODULATION; ATOMIC FORCE MICROSCOPY; MODULATION; RESONANCE; SCANNING PROBE MICROSCOPY; VISCOELASTICITY;

AMPLITUDE MODULATION AFM; FREQUENCY DEPENDENT; NANOMECHANICAL; OPERATING CONDITION; RESONANCE TRACKING; THERMOPLASTIC POLYMER; VISCO-ELASTIC PARAMETERS; VISCOELASTIC PROPERTIES;

POLYMERS;

EID: 84897062015     PISSN: 09570233     EISSN: 13616501     Source Type: Journal    
DOI: 10.1088/0957-0233/25/5/055402     Document Type: Article

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