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Volumn , Issue , 2002, Pages 179-182

Efficient monte carlo simulation of tunnel currents in MOS structures

Author keywords

[No Author keywords available]

Indexed keywords

COMPARISONS WITH MEASUREMENTS; DEVICE SIMULATORS; MONTE CARLO DEVICE SIMULATIONS; MOS STRUCTURE; MOSFETS; QUANTUM CORRECTION; TUNNEL CURRENTS; TUNNELING PROBABILITIES;

EID: 84896863538     PISSN: 19308876     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ESSDERC.2002.194899     Document Type: Conference Paper
Times cited : (2)

References (10)
  • 2
    • 0033357461 scopus 로고    scopus 로고
    • Efficient full-band Monte Carlo simulation of silicon devices
    • C. Jungemann, S. Keith, M. Bartels, and B. Meinerzhagen, "Efficient full-band Monte Carlo simulation of silicon devices," IEICE Trans. on Electronics, vol. E82-C, no. 6, pp. 870-879, 1999.
    • (1999) IEICE Trans. on Electronics , vol.E82-C , Issue.6 , pp. 870-879
    • Jungemann, C.1    Keith, S.2    Bartels, M.3    Meinerzhagen, B.4
  • 3
    • 0034246408 scopus 로고    scopus 로고
    • Simulation of direct tunneling through stacked gate dielectrics by a fully integrated 1D-Schrödinger-Poisson solver
    • A. Wettstein, A. Schenk, and W. Fichtner, "Simulation of direct tunneling through stacked gate dielectrics by a fully integrated 1D-Schrödinger-Poisson solver," IEICE Trans. on Electronics, vol. E83-C, no. 8, pp. 1189-1193, 2000.
    • (2000) IEICE Trans. on Electronics , vol.E83-C , Issue.8 , pp. 1189-1193
    • Wettstein, A.1    Schenk, A.2    Fichtner, W.3
  • 4
    • 0032614408 scopus 로고    scopus 로고
    • Study of direct tunneling through ultrathin gate oxide of field effect transistors using Monte Carlo simulation
    • E. Cassan, S. Galdin, and P. Hesto, "Study of direct tunneling through ultrathin gate oxide of field effect transistors using Monte Carlo simulation," J. Appl. Phys., vol. 86, pp. 3804-3811, 1999.
    • (1999) J. Appl. Phys. , vol.86 , pp. 3804-3811
    • Cassan, E.1    Galdin, S.2    Hesto, P.3
  • 5
    • 0020177405 scopus 로고
    • A modified local density approximation - Electron density in inversion layers
    • G. Paasch and H. Übensee, "A modified local density approximation - electron density in inversion layers," Phys. Status Solidi B, vol. 113, pp. 165-178, 1982.
    • (1982) Phys. Status Solidi B , vol.113 , pp. 165-178
    • Paasch, G.1    Übensee, H.2
  • 7
    • 84907689857 scopus 로고    scopus 로고
    • Quantum correction of electron density for Monte Carlo device simulation
    • Bremen, Germany
    • D. Grgec, C. D. Nguyen, C. Jungemann, and B. Meinerzhagen, "Quantum correction of electron density for Monte Carlo device simulation," in Proc. of Analog '02, (Bremen, Germany), 2002.
    • (2002) Proc. of Analog '02
    • Grgec, D.1    Nguyen, C.D.2    Jungemann, C.3    Meinerzhagen, B.4
  • 9
    • 0033579745 scopus 로고    scopus 로고
    • Analytic model for direct tunneling current in polycrystalline silicon-gate metal-oxide-semiconductor devices
    • L. F. Register, E. Rosenbaum, and K. Yang, "Analytic model for direct tunneling current in polycrystalline silicon-gate metal-oxide-semiconductor devices," Appl. Phys. Lett., vol. 74, pp. 457-459, 1999.
    • (1999) Appl. Phys. Lett. , vol.74 , pp. 457-459
    • Register, L.F.1    Rosenbaum, E.2    Yang, K.3
  • 10


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.