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Volumn , Issue , 2001, Pages 458-461

Improved modified local density approximation for modeling of size quantization in NMOSFETs

Author keywords

Inversion layer; MOS devices; Quantization effects

Indexed keywords

APPROXIMATION THEORY; CAPACITANCE; CARRIER CONCENTRATION; COMPUTER SIMULATION; CRYSTAL LATTICES; DOPING (ADDITIVES); ELECTRIC CONDUCTIVITY; ELECTROSTATICS; MATHEMATICAL MODELS; QUANTUM THEORY; SILICA; SILICON; THERMAL EFFECTS; THRESHOLD VOLTAGE;

EID: 0842306691     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (22)

References (11)
  • 1
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    • Ando, T.1    Fowler, A.B.2    Stern, F.3
  • 2
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    • F. Stern, "Self-consistent results for n-type Si inversion layers", Phys. Rev. B, vol. 5, pp. 4891-4899, 1972.
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    • Stern, F.1
  • 3
    • 0032098559 scopus 로고    scopus 로고
    • Self-consistent 2-D model for quantum effects in n-MOS transistors
    • A. S. Spinelli, A. Benvenuti, and A. Pacelli, "Self-consistent 2-D model for quantum effects in n-MOS transistors", IEEE Trans. Electron Devices, vol. 45, pp. 1342-1349, 1998.
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    • Spinelli, A.S.1    Benvenuti, A.2    Pacelli, A.3
  • 4
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    • A simple model for quantisation effects in heavily-doped silicon MOSFETs at inversion conditions
    • M. J. van Dort, P. H. Woerlee, and A. J. Walker, "A simple model for quantisation effects in heavily-doped silicon MOSFETs at inversion conditions", Solid-State Electron., vol. 37, pp. 411-414, 1994.
    • (1994) Solid-state Electron. , vol.37 , pp. 411-414
    • Van Dort, M.J.1    Woerlee, P.H.2    Walker, A.J.3
  • 5
    • 0002899780 scopus 로고    scopus 로고
    • Multi-dimensional quantum effect simulation using a density-gradient model and script-level programming techniques
    • C. S. Rafferty, B. Biegel, Z. Yu, M. C. Ancona, J. Bude, and R. W. Dutton, "Multi-dimensional quantum effect simulation using a density-gradient model and script-level programming techniques", in Proc. SISPAD, 1998, pp. 137-140.
    • (1998) Proc. SISPAD , pp. 137-140
    • Rafferty, C.S.1    Biegel, B.2    Yu, Z.3    Ancona, M.C.4    Bude, J.5    Dutton, R.W.6
  • 6
    • 0020177405 scopus 로고
    • A modified local density approximation - Electron density in inversion layers
    • G. Paasch and H. Übensee, "A modified local density approximation - electron density in inversion layers", Phys. Status Solidi B, vol. 113, pp. 165-178, 1982.
    • (1982) Phys. Status Solidi B , vol.113 , pp. 165-178
    • Paasch, G.1    Übensee, H.2
  • 7
    • 0027692894 scopus 로고
    • Simulation of linear and nonlinear electron transport in ho mogeneous silicon inversion layers
    • C. Jungemann, A. Emunds, and W. L. Engl, "Simulation of linear and nonlinear electron transport in ho mogeneous silicon inversion layers", Solid-State Electron., vol. 36, pp. 1529-1540, 1993.
    • (1993) Solid-state Electron. , vol.36 , pp. 1529-1540
    • Jungemann, C.1    Emunds, A.2    Engl, W.L.3
  • 8
    • 6344251261 scopus 로고    scopus 로고
    • Efficient quantum correction model for multi-dimensional CMOS simulations
    • Leuven (Belgium)
    • M. Ieong, R. Logan, and J. Slinkman, "Efficient quantum correction model for multi-dimensional CMOS simulations", in Proc. SISPAD, Leuven (Belgium), 1998, pp. 129-132.
    • (1998) Proc. SISPAD , pp. 129-132
    • Ieong, M.1    Logan, R.2    Slinkman, J.3
  • 10
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    • On the number of fast interface states of standard CMOS technologies
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    • (1999) IEEE Electron Device Lett. , vol.20 , pp. 283-285
    • Jungemann, C.1    Meinerzhagen, B.2    Eller, M.3
  • 11


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.