Temperature dependence of imprint mechanism in poly(vinylidene fluoride-trifluoroethylene) copolymer ultrathin films

Applied Physics Letters

Volumn 104, Issue 10, 2014, Pages

  Zhang, Xiuli ^a,b   Du, Xiaoli ^a   Hou, Ying ^b   Lü, Zhaoyue ^b   Xu, Haisheng ^b,c  

^a SHANGHAI UNIVERSITY OF ENGINEERING SCIENCE   (China)

^b EAST CHINA UNIVERSITY OF SCIENCE AND TECHNOLOGY   (China)

^c Kunshan Hisense Electronics Co Ltd   (China)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITORS; COPOLYMERS; ELECTRIC FIELDS; FERROELECTRIC THIN FILMS; FERROELECTRICITY; MOLECULAR BIOLOGY; TEMPERATURE DISTRIBUTION; THIN FILM CIRCUITS; ULTRATHIN FILMS;

ANNEALING TEMPERATURES; FERROELECTRIC THIN-FILM CAPACITORS; INTERNAL ELECTRIC FIELDS; P COPOLYMER THIN FILMS (VDFTRFE); POLARIZATION REVERSALS; POLY(VINYLIDENE FLUORIDE-TRIFLUOROETHYLENE); TEMPERATURE CONDITIONS; TEMPERATURE DEPENDENCE;

ANNEALING;

EID: 84896291238     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4868413     Document Type: Article

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