Characterizing mechanical behavior of atomically thin films: A review

Journal of Materials Research

Volumn 29, Issue 3, 2014, Pages 338-347

  Cao, Changhong ^a   Sun, Yu ^a   Filleter, Tobin ^a  

^a UNIVERSITY OF TORONTO   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

MECHANICAL BEHAVIOR;

EID: 84894327929     PISSN: 08842914     EISSN: 20445326     Source Type: Journal    
DOI: 10.1557/jmr.2013.339     Document Type: Review

References (52)

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