Surface roughness limited mobility modeling in ultra-thin SOI and quantum well III-V MOSFETs

Technical Digest - International Electron Devices Meeting, IEDM

Volumn , Issue , 2013, Pages

  Lizzit, Daniel ^a   Esseni, David ^a   Palestri, Pierpaolo ^a   Selmi, Luca ^a  

^a UNIVERSITY OF UDINE   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84894318010     PISSN: 01631918     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IEDM.2013.6724565     Document Type: Conference Paper

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