Crystal structure of Si-doped HfO2

Journal of Applied Physics

Volumn 115, Issue 3, 2014, Pages

  Zhao, Lili ^a,b,c   Nelson, Matthew ^a   Aldridge, Henry ^c   Iamsasri, Thanakorn ^a,c   Fancher, Chris M ^a   Forrester, Jennifer S ^a,c   Nishida, Toshikazu ^c   Moghaddam, Saeed ^d   Jones, Jacob L ^a,c  

^a North Carolina State University   (United States)

^b NORTHWEST UNIVERSITY   (China)

^c University of Florida   (United States)

^d UNIVERSITY OF FLORIDA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHROMIUM COMPOUNDS; CRYSTAL STRUCTURE; HAFNIUM OXIDES; RIETVELD REFINEMENT; SILICA; SILICATE MINERALS; X RAY DIFFRACTION ANALYSIS;

CRISTOBALITES; FERROELASTICS; HIGH RESOLUTION X RAY DIFFRACTION; SECOND PHASE; SI DOPANT; SOLID-STATE SYNTHESIS; SPONTANEOUS STRAIN; UNIT CELLS;

SILICON;

EID: 84893274909     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4861733     Document Type: Article

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