SCOPUS 정보 검색 플랫폼

Volumn 552, Issue , 2014, Pages 56-61

Effect of crystalline polarity on microstructure and optoelectronic properties of gallium-doped zinc oxide films deposited onto glass substrates

(9) Ogino, Tsuyoshi a,b,c Williams, Jesse R a Watanabe, Ken a Sakaguchi, Isao a,c Hishita, Shunichi a Haneda, Hajime a,c Adachi, Yutaka a Ohgaki, Takeshi a Ohashi, Naoki a,c

a NATIONAL INSTITUTE FOR MATERIALS SCIENCE (Japan)

b TAIYO YUDEN CO LTD (Japan)

c KYUSHU UNIVERSITY (Japan)

Author keywords

Doping; Grain growth; Polarity; Zinc oxide film

Indexed keywords

ABNORMAL GROWTH; DOPED ZINC OXIDES; GALLIUMDOPED ZINC OXIDES (GZO); GLASS SUBSTRATES; GZO FILMS; OPTOELECTRONIC PROPERTIES; POLARITY;

CRYSTALLINE MATERIALS; DOPING (ADDITIVES); GALLIUM; GLASS; GRAIN GROWTH; MICROSTRUCTURE; OXIDE FILMS; PHOTOELECTRONS; SUBSTRATES; X RAY PHOTOELECTRON SPECTROSCOPY; ZINC OXIDE;

SEMICONDUCTOR DOPING;

EID: 84892795393 PISSN: 00406090 EISSN: None Source Type: Journal
DOI: 10.1016/j.tsf.2013.12.017 Document Type: Article

Times cited : (16)

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