Thickness study of Al:ZnO film for application as a window layer in Cu(In 1-x Ga x )Se 2 thin film solar cell

Applied Surface Science

Volumn 257, Issue 9, 2011, Pages 4026-4030

  Islam, M M ^a   Ishizuka, S ^b   Yamada, A ^b   Matsubara, K ^b   Niki, S ^b   Sakurai, T ^a   Akimoto, K ^a  

^a UNIVERSITY OF TSUKUBA   (Japan)

^b NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

Author keywords

Al:ZnO layer thickness; Efficiency; Solar cell

Indexed keywords

EFFICIENCY; FILM THICKNESS; II-VI SEMICONDUCTORS; MAGNETRON SPUTTERING; METALLIC FILMS; OPTICAL PROPERTIES; SOLAR CELLS; THIN FILMS; ZINC OXIDE;

CIGS SOLAR CELLS; ELECTRICAL AND OPTICAL PROPERTIES; ELECTRICAL AND STRUCTURAL PROPERTIES; RADIO-FREQUENCY MAGNETRON SPUTTERING SYSTEM; WINDOW LAYER; ZNO FILMS; ZNO LAYERS;

THIN FILM SOLAR CELLS;

EID: 78951475262     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2010.11.169     Document Type: Article

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