Polymorphism in bulk and thin films: The curious case of dithiophene-DPP(Boc)-dithiophene

Journal of Physical Chemistry C

Volumn 118, Issue 1, 2014, Pages 657-669

  Salammal, Shabi Thankaraj ^a   Balandier, Jean Yves ^a   Arlin, Jean Baptiste ^a   Olivier, Yoann ^b   Lemaur, Vincent ^b   Wang, Linjun ^b   Beljonne, David ^b   Cornil, Jéroîme ^b   Kennedy, Alan Robert ^c   Geerts, Yves Henri ^a   Chattopadhyay, Basab ^a  

^a UNIVERSITÉ LIBRE DE BRUXELLES   (Belgium)

^b UNIVERSITY OF MONS   (Belgium)

^c UNIVERSITY OF STRATHCLYDE   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

HIRSHFELD SURFACES; INTERFACE MORPHOLOGIES; INTERMOLECULAR INTERACTIONS; LATTICE ENERGY CALCULATIONS; STRUCTURAL CHARACTERIZATION; STRUCTURE PROPERTY RELATIONSHIPS; SUPRAMOLECULAR ARCHITECTURES; X-RAY DIFFRACTION DATA;

FUNCTIONAL MATERIALS; INTERFACES (MATERIALS); THIN FILMS; X RAY DIFFRACTION;

POLYMORPHISM;

EID: 84892581504     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp410824u     Document Type: Article

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