A one-versus-all class binarization strategy for bearing diagnostics of concurrent defects

Sensors (Switzerland)

Volumn 14, Issue 1, 2014, Pages 1295-1321

  Ng, Selina S Y ^a   Tse, Peter W ^a   Tsui, Kwok L ^a  

^a CITY UNIVERSITY OF HONG KONG   (Hong Kong)

Author keywords

Bearing; Class binarization; Decision tree; Fault diagnostics; Multiple defects; Support vector machine (SVM)

Indexed keywords

BEARINGS (STRUCTURAL); DATA MINING; DECISION TREES; DEFECTS;

BINARIZATIONS; CLASSIFICATION ALGORITHM; DIAGNOSTICS AND PROGNOSTICS; FAULT DIAGNOSTICS; MULTI-CLASS CLASSIFICATION; MULTIPLE DEFECTS; PREDICTION PERFORMANCE; STATISTICAL FEATURES;

SUPPORT VECTOR MACHINES;

EID: 84892572163     PISSN: 14248220     EISSN: None     Source Type: Journal    
DOI: 10.3390/s140101295     Document Type: Article

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