Lifetime measurements on attached epilayers and detached epifoils grown on reorganised porous silicon showing a bulk lifetime exceeding 100 μs

Energy Procedia

Volumn 38, Issue , 2013, Pages 950-958

  Radhakrishnan, Hariharsudan Sivaramakrishnan ^a,b   Debucquoy, Maarten ^a   Korsós, Ferenc ^c   Van Nieuwenhuysen, Kris ^a   Depauw, Valérie ^a   Gordon, Ivan ^a   Mertens, Robert ^a,b   Poortmans, Jef ^a,b  

^a IMEC   (Belgium)

^b UNIVERSITY OF LEUVEN   (Belgium)

^c SEMILAB SEMICONDUCTOR PHYSICS LABORATORY CO LTD   (Hungary)

Author keywords

Bulk lifetime; Epilayer; PC1D; PL; Porous silicon; QSSPC; Surface recombination velocity; PCD

Indexed keywords

EID: 84891603207     PISSN: 18766102     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1016/j.egypro.2013.07.369     Document Type: Conference Paper

References (12)

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