An empirical bayes testing procedure for detecting variants in analysis of next generation sequencing data

Annals of Applied Statistics

Volumn 7, Issue 4, 2013, Pages 2229-2248

  Zhao, Zhigen ^a   Wang, Wei ^b   Wei, Zhi ^b  

^a TEMPLE UNIVERSITY   (United States)

^b University Heights   (United States)

Author keywords

Bayesian FDR; Multiplicity control; Next generation sequencing; Optimality; Variant call

Indexed keywords

EID: 84891543623     PISSN: 19326157     EISSN: 19417330     Source Type: Journal    
DOI: 10.1214/13-AOAS660     Document Type: Article

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